DALIA G. YABLON
Sortuj według:
Scanning Probe Microscopy for Industrial Applications

Scanning Probe Microscopy for Industrial Applications

4.00

Autor: Dalia G. Yablon

Wydawnictwo: John Wiley Sons
ISBN: 9781118288238
Kategoria: Naukowe, popularnonaukowe
Covering a diverse range of practical applications and real-world examples, Scanning Probe Microscopy for Industrial Applications examines important and successful applications of SPM in various industries, including food science, personal care industry, and forestry applications. Author D. G. Yablon details how SPM has impacted the industrial...
Cena
443.00zł
Tania Książka
Zobacz książkę Kup książkę
Strona: 1 Do góry