X-Ray Optics and Microanalysis - Melissa Denecke

X-Ray Optics and Microanalysis
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Autor: Melissa Denecke

 Wydawnictwo: Springer Verlag
ISBN: 9780735407640
EAN:
Format: ...
Oprawa: twarda
Stron: 228
Data wydania: 2010-08-01
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"ICXOM Series" is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.

Książka "X-Ray Optics and Microanalysis"
Melissa Denecke